Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineers

Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineers

Publisher: Chapman and Hall
ISBN: 9781466586888
Author: Scott Pardo
Dispatch Time: 15 - 30 Days
Format: Hard Cover
Number of Pages: 232
Year of Published: 2013
Our Price: £85.00

In engineering and quality control, various situations, including process validation and design verification, require equivalence and noninferiority tests. Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineerspresents methods for using validation and verification test data to demonstrate equivalence and noninferiority in engineering and applied science.

The book covers numerous tests drawn from the author’s more than 30 years of work in a range of industrial settings. It provides computational formulas for the tests, methods to determine or justify sample sizes, and formulas to calculate power and operating characteristic curves. The methods are accessible using standard statistical software and do not require complicated programming. The book also includes computer code and screen shots for SAS, R, and JMP.

This book provides you with a guide to performing validation and verification tests that demonstrate the adequacy of your process, system, or product. It will help you choose the best test for your application.

Table of Contents

Proportions and Binomial Random Variables
Single Binomial Proportion (One-Sided; Probability of "Success")
Single Binomial Proportion (Two-Sided) 
Difference of Two Proportions (Two-Sided)

Means
Single Mean (One-Sided) 
Comparison of Two Means—Two Independent Samples, Fixed Δ Paradigm (One-Sided) 
Comparison of Two Means—Proportional Difference Paradigm for Two Independent Samples (One-Sided) 
Single Mean (Two-Sided) 
A Special Case of Single Mean (Two-Sided)—Regression Slope
Comparison of Two Means—Two Independent Samples (Two-Sided) 
A Special Case of Comparison of Two Means—Two Independent Samples (Two-Sided), Two-Level Factorial Validation/Verification Experiment
Comparison of Two Means—Proportional Difference Paradigm for Two Independent Samples (Two-Sided)

Variances (Standard Deviations) and Coefficients of Variation

Single Variance (One-Sided) 
Comparison of Two Variances (One-Sided) 
Single Coefficient of Variation (One-Sided)

Exponential Rate Parameters

Single Exponential Rate Parameter (One-Sided) 
Two Exponential Rate Parameters (One-Sided)

Capability Indices

Cpk 
Cp

Multivariate

Multivariate—Single Mean Vector (Two-Sided)

Reliability

Comparison of Reliability Using Parametric Models
Nonparametric Test for Comparison of Reliability
Accelerated Life Test with Type I Censoring

Sample-Based Criteria

Single Proportion
Single Mean
Relative Difference between Two Means
Single Standard Deviation

Comparing Sequences of Points
Two Sequences, Variability Known
Two Sequences, Variability Unknown

Calculating Sample Sizes

Computer Code—Power Curves
Single Binomial Proportion (One-Sided; Probability of "Success")
Single Mean (One-Sided)
Comparison of Two Means—Two Independent Samples, Fixed Δ Paradigm (One-Sided)
Comparison of Two Means—Proportional Difference Paradigm for Two Independent Samples (One-Sided) 
Single Variance (One-Sided) 
Comparison of Two Variances (One-Sided) 
Single Coefficient of Variation (One-Sided) 
Single Exponential Rate Parameter (One-Sided) 
Two Exponential Rate Parameters (One-Sided) 
Cpk
Cp
Multivariate—Single Mean Vector
Two Sequences, Variability Known
Two Sequences, Variability Unknown

References

Appendix I: Review of Some Probability and Statistics Concepts
Appendix II

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